Fully Automatic Inertial Chip Detection Automation System
Application Scenarios:
① Dynamic testing of Mems chips (gyroscope+angular velocity meter).
Previous Solutions:
① Manually conducting tests is inefficient;
② Purchasing foreign equipment at too high a price;
③ Long procurement lead time;
④ The service cycle for algorithm modification is long and the cost is high;
YongMing Solution:
① Two independently controlled high-speed three-axis turntables;
② Support high temperature；
③ UPH>1600pcs (testing time<10S);
The relevant parameters of the turntable are as follows:
